Film Data Sheet
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I. Holography
II. Hologram Development Procedures
III. Film Data Sheet
Film Data Sheet The VRP-M and PFG-01 Materials
Characteristic curves for these emulsions, showing spectral sensitivity versus wavelength, are shown in figure 1. The VRP-M light sensitivity (CW radiation) is seen to peak at approximately 75 microJoules/cm2 and that of PFG-01 (CW radiation) at approximately 100 microJoules/cm2. Figure 2 shows the optical density after exposure by CW radiation and development versus energy.
Grain size characteristics for the VRP-M and PFG-01 emulsions are presented in Figure 3. The diffraction efficiency versus exposure for reflection holograms recorded on PFG-01 (using a CW laser) and on VRP-M (using a pulsed laser) is presented in figure 4. The maximum diffraction efficiency is seen to be >40% for both emulsions. Material life is more than two years.
The VRP-M emulsion may be used equally well with frequency-double pulsed Neodymium lasers as with green CW radiation. The PFG-01 emulsion, however, is not sensitive to pulsed radiation from the Ruby laser and as such should be only used with CW sources. Emulsions used with pulsed radiation should be post-sensitized with the technique of latensification (see section below).
Description of PFG-01 (This is the film we use)
Fine-grained red sensitive holographic plates and film designed for transmission or reflection hologram recording. Average grain size is 40nm, resolving power more than 3000 lines/mm, spectral sensitivity range 600-680nm (including 633nm, 647nm).
Summary of Technical Specifications
| Parameter | PFG-01 |
| Holographic Sensitivity | |
| @ 457nm CW microJoules/cm2 | |
| @ 488nm CW microJoules/cm2 | |
| @ 514.5nm CW microJoules/cm2 | |
| @ 526.5nm 30ns pulse with latensification microJoules/cm2 | |
| @ 633nm microJoules/cm2 | 100 |
| Gamma | >6.0 |
| Max Density on Characteristic Curve (Dmax) | <4.0 |
| Fog Density (DO) | <0.01 |
| Resolving Power (R), mm-1 | 3000 |
| Max. of Spectral Sensitization, nm | 633 |
| Swollen Emulsion Layer Strength after Chemical Processing, H (gm force) | 900 |
| Adhesion between Emulsion layer and Base after chemical processing (Class A-F) | A-C |
| Deformation Temperature of Emulsion Layer in water (tdef), °C | >90°C |
| Emulsion Layer Thickness (microns) | 7 to 8 |
| Normal Diffraction Efficiency for Reflection | |
| @ 457nm, % | |
| @ 488nm, % | |
| @ 514.5nm, % | |
| @ 526.5nm, % | |
| @ 633nm, % | >40% |
| Geola Guaranteed Storage Period at 4°C, 30% Humidity | |
| Film Roll (months) | 18 |
| Cut Sheets (months) | 12 |
| Plates (months) | 18 |




